EDX 3600H Full-Element Analyser

The EDX3600H is powerful benchtop XRF spectrometer for elemental analysis in industry process control and research and development. It combines the highest-performance hardware with the latest developments in software algorithms and data processing to deliver an outstanding performance in it’s accuracy, precision and detection limits across the element range from sodium (Na) to uranium (U). Some of the applications of the EDX3600H include:

Alloys identification and quality control.
Mineral / mining ore analysis.
RoHS screening.
Precious metals.
Plated layer analysis.
Light element analysis.
Soil analysis.
Materials research.

Instrument UK

Some features include:

A high efficiency super-thin window x-ray tube.
High performance electronically cooled ultra high-resolution silicon drift detector.
Patented signal-to-noise enhancer for improved signal processing.
Automated collimator and filter switching for improved detection and profiling.
Intelligent vacuum chamber to further enhance light element analysis (Na, Mg, Si, S and Al).
HD camera for easier and more accurate sample alignment.