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Skyray XRF Analysers

  Handheld                         Explorer,  Genius,  Pocket III

  Precious Metals               EDX600,  EDX880,  EDX3000

  Professional RoHS          EDX2800,   EDX1800B

  Full -Element                   EDX3600B,  EDX3600H,  EDX6000B

  Plating Thickness            Thick 800A

  Wavelength Dispersive   WDX Series

  Plasma Spectroscopy     ICP 2000

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WDX Series - Wavelength Dispersive Analysers

WDX200 Wavelength Dispersive XRF Analyser

WDX 400

WDX400 Wavelength Dispersive XRF Analyser

WDX 200

Specifications

Elements:                                    from Na to U (up to 10 simultaneously).

Tube Voltage & Current Stability:   0.05 % (12 hrs).

High Voltage Supply:                    200W (50 KV, 4 mA).

X-ray Tube:                                  Varian 400 W thin Be window, Rh anode.

Measurement Time:                      ≤3-5 min (including sample changing and vacuum pumping).

Detector:                                     gas proportional detector + sealed proportional detector.

Temperature Control Accuracy of Chamber: ±0.1 ºC.

Software: equipped with quantitative analysis algorithms - empirical and theoretical a-coefficient.




The WDX400 is Wavelength Dispersive Spectrometer equipped with a higher power x-ray tube than the WDX200 and has a higher excitation efficiency and lower limit of detection providing a higher measurement precision and a more stable measurement data.

Specifications

Elements:                                     from Na to U (up to 10 simultaneously).

Tube Voltage & Current Stability:    0.05 % (12 hrs).

High Voltage Supply:                     400W (50 KV, 8 mA).

X-ray Tube:                                   Varian 400 W thin Be window, Rh anode.

Measurement Time:                       ≤3-5 min (including sample changing and vacuum pumping).

Detector:                                       gas proportional detector + sealed proportional detector.

Temperature Control Accuracy of Chamber: ±0.1 ºC.

Software: equipped with quantitative analysis algorithms - empirical and theoretical a-coefficient.



The WDX series is a compact Multi-channel X-ray Fluorescence Spectrometer using Wavelength Dispersive X-ray Fluorescence producing a higher precision in detection and analysis of materials. It is most widely used for quality control in a wide range of industries including analysis of cement and steel production, powder metallurgy, glass, refractory materials, petroleum and environmental protection.

WDX 400E

The Latest Generation of X-ray Fluorescence Spectrometer

Advantages

The WDX400E is virtually identical to the WDX400 in appearance but is enhanced incorporating simultaneous measurement of both Wavelength and Energy Dispersive X-ray Fluorescence. This brings a higher performance instrument but is achieved with much lower x-ray tube power than typical scan channel techniques and therefore brings many advantages. It can analyse a wide range of elements from sodium (Na) to uranium (U) (up to 10 simultaneously).

WDX400E - XRF Analyser Incorporating EDX and WDX Technologies

Instrument UK

EDX600_new.pdf

Download the brochure here

EDX600_new.pdf

Download the brochure here

EDX600_new.pdf

Download the brochure here