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Skyray XRF Analysers

  Handheld                         Explorer,  Genius,  Pocket III

  Precious Metals               EDX600,  EDX880,  EDX3000

  Professional RoHS          EDX2800,   EDX1800B

  Full -Element                   EDX3600B,  EDX3600H,  EDX6000B

  Plating Thickness            Thick 800A

  Wavelength Dispersive   WDX Series

  Plasma Spectroscopy     ICP 2000

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Thick 800A Plating Thickness Analyser

Download the brochure here

The Thick800A XRF Analyser is designed for rapid and non-destructive analysis of plating layer thickness and compositions of plating and plating solutions. Some features of the Thick 800A include:

• Top lighting for easier measurement of samples of differing thickness.
• Auto-height sample positioning with laser guiding.
• Auto spot search for precise test point alignment.
• Precision positioning sample holder.
• Micro Collimator for improved testing accuracy.
• Point and click by mouse test point determination.

Altitude Transducer.

Si-PIN Semiconductor Detector.

Measurement of up to 5 plating layers.

Micro collimator to improve testing accuracy.

Elements:                  Na to U (more than 24 simultaneously).

Content Range:          1 ppm - 99.99%.

Repeatability:             0.1%

Long period stability:   0.1%

Dimensions:               648 x 490 x 544 mm

Sample Chamber:       517 x 352 x 150 mm

Thick 800A Specifications

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